| Contents: |
- Defect and Failure Verification, Characterization and Localization
- De-Processing
- Testing, Inspection, and Sample Preparation
- ESD Damage
- Failure-Analysis Techniques
- Backside Analysis
- Focused Ion-Beam Systems
- Discrete Electronic Devices
- Packaging
- Military Applications
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Case Histories
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| ISTFA '98: 24th International Symposium for Testing and Failure Analysis |
| ASM Publication, 413 pp., 1998, ISBN: 0871706695 |
| Proceedings, ISTFA '98 Dallas, TX, 15-19 November 1998 |
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This volume presents the latest information from
international specialists in the testing and failure
analysis of microelectronic devices.
The papers
included discuss new aspects of the procedures used to
assure the quality of these devices that form the
heart of modern control and communication equipment as
well as the established practices used in this
important field. |
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| $124.00 |
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